1 July 1992 Influence of the spectral line distortion due to diode laser frequency fluctuations on the hydrogen fluoride R4 (v=0-2) line broadening
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Proceedings Volume 1811, Tenth All-Union Symposium and School on High-Resolution Molecular Spectroscopy; (1992) https://doi.org/10.1117/12.131158
Event: Tenth All-Union Symposium and School on High Resolution Molecular Spectroscopy, 1991, Omsk, Russian Federation
Abstract
Broadening of the hydrogen fluoride R4 ((nu) equals 0 - 2) absorption line by N2 measured with 1.3 micrometers diode laser was studied. Line parameters (Doppler and Lorentzian half widths, line strength) have been extracted by the least-squares fitting with Voigt function. The spectrum of frequency fluctuations was modeled and its parameters were determined. The line parameters have been improved by taking into account the influence of the diode laser frequency fluctuations.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. G. Avetisov, V. G. Avetisov, Alexander I. Nadezhdinskii, Alexander I. Nadezhdinskii, Patimat M. Omarova, Patimat M. Omarova, Amir N. Khusnutdinov, Amir N. Khusnutdinov, } "Influence of the spectral line distortion due to diode laser frequency fluctuations on the hydrogen fluoride R4 (v=0-2) line broadening", Proc. SPIE 1811, Tenth All-Union Symposium and School on High-Resolution Molecular Spectroscopy, (1 July 1992); doi: 10.1117/12.131158; https://doi.org/10.1117/12.131158
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