Paper
26 October 1992 ETM cold-focal-plane thermal vaccum testing
Bing T. Yang
Author Affiliations +
Proceedings Volume 1814, Optical Sensors; (1992) https://doi.org/10.1117/12.131277
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan
Abstract
The paper describes the tests performed on the enhanced thematic mapper (ETM) cold focal plane array (CFPA) after it was fully characterized in a test dewar and before the full instrument integration. The cold focal plane array was first integrated onto the radiative cooler with the thermal switch open so there is no thermal conduction between the radiator cold stage and the CFPA. A Joule-Thompson cooler was used to cool the CFPA during the before- and after-vibration tests. After these two bench-level tests the thermal switch was closed and the CFPA cooler assembly was prepared for the final thermal-vacuum chamber testing. This test encompasses two major goals. The first one is to make certain that the cooler performance meets specifications. This was done with the cooler facing a simulated cold space background and proper thermal loads were impressed. The second is to adjust the band 6 (PC HgCdTe) preamp circuits so maximum dynamic range can be realized during the actual flight environment. The work was performed while the author was affiliated with Santa Barbara Research Center.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bing T. Yang "ETM cold-focal-plane thermal vaccum testing", Proc. SPIE 1814, Optical Sensors, (26 October 1992); https://doi.org/10.1117/12.131277
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KEYWORDS
Sensors

Liquids

Optical sensors

Staring arrays

Switches

Resistors

Earth observing sensors

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