28 October 1992 Surface roughness investigations of thin film disks used in magnetic recording technology
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Proceedings Volume 1816, Electro-Optic Computer Peripherals Technology; (1992) https://doi.org/10.1117/12.131330
Event: International Symposium on Optoelectronics in Computers, Communications, and Control, 1992, Hsinchu, Taiwan
Abstract
Scanning tunneling microscopy (STM) is used to study the surface roughness of thin film magnetic recording disks obtained from various vendors. The height distributions of the disk surfaces are obtained and the bearing area curves are examined using `probability scaling.'' Skewness and kurtosis of the individual disk surfaces are calculated and deviation of the height distributions and bearing area curves from Gaussian behavior is determined. Surface roughness data from scanning tunneling microscopy measurements are compared qualitatively with those obtained from optical noncontact profilometry.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Min Yang, Frank E. Talke, "Surface roughness investigations of thin film disks used in magnetic recording technology", Proc. SPIE 1816, Electro-Optic Computer Peripherals Technology, (28 October 1992); doi: 10.1117/12.131330; https://doi.org/10.1117/12.131330
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