28 May 1993 Incorporation of a FADOF to an ESPI system
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Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145539
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
Electronic Speckle Pattern Interferometry (ESPI) has been used for many years in nondestructive testing applications in laboratories. Field applications of ESPI systems have been limited by the need to restrict the amount of light, sunlight and other sources, during operation. Interference filters and other techniques have been tried to increase the applicability of ESPI systems in daylight environments. Each of these attempts have been moderately successful. The FADOF (Faraday Anomalous Dispersion Optical Filter) is a revolutionary filter that improves throughput, field-of-view, and the signal-to-noise ratio of the laser signal returning from the test object. This paper describes the basics of a FADOF and how the filter can be incorporated into an ESPI system.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Larryl K. Matthews, Larryl K. Matthews, Thomas M. Shay, Thomas M. Shay, Gabriel V. Garcia, Gabriel V. Garcia, } "Incorporation of a FADOF to an ESPI system", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145539; https://doi.org/10.1117/12.145539
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