28 May 1993 Integration of ESPI and structural analysis to determine the impact of structural defects
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Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145576
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
The identification of a defect and the ability to determine its impact on the structure provides the information needed to determine the resulting integrity of the structure. Electronic Speckle Pattern Interferometry (ESPI) is used to help find defects. One shortcoming of ESPI is the inability to determine the impact of the defect on the overall structural integrity. Displacement and strain data from ESPI measurements can be used to determine the parameters of a structure, thus providing a quantifiable means of determining the structural integrity. Parameter estimation techniques provide the means to bring ESPI data and structural models together. An example of the integration of parameter estimation and ESPI displacement output on a fixed-free supported beam will be discussed in this paper.
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Gabriel V. Garcia, Gabriel V. Garcia, Larryl K. Matthews, Larryl K. Matthews, L. M. Hickman, L. M. Hickman, } "Integration of ESPI and structural analysis to determine the impact of structural defects", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); doi: 10.1117/12.145576; https://doi.org/10.1117/12.145576
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