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28 May 1993 Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry
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Proceedings Volume 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing; (1993) https://doi.org/10.1117/12.145538
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
Electronic speckle pattern interferometry is elaborated in such a way that also spatially resolved image decorrelation can be measured. While retaining the typical ESPI setup for deformation measurements, a speckle correlation formalism is implemented based on the phase-shift method. In many practical situations decorrelation is directly related to surface microstructure changes of a test specimen. Feasibility and restrictions of the method are illustrated by measurements of water-induced changes at the surfaces of natural stones and by monitoring microbiological activity on stones.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerd Guelker, Klaus D. Hinsch, and Claudia Hoelscher "Mapping of microstructural surface changes by phase-shifting electronic speckle pattern interferometry", Proc. SPIE 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing, (28 May 1993); https://doi.org/10.1117/12.145538
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