Grain velocity measurement using a linear image sensor

Changhe Chen; Michael F. Kocher; David D. Jones

doi:10.1117/12.144022

12 May 1993 Grain velocity measurement using a linear image sensor

Changhe Chen, Michael F. Kocher, David D. Jones

Proceedings Volume 1836, Optics in Agriculture and Forestry; (1993) https://doi.org/10.1117/12.144022
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States

Abstract

A metal-oxide semiconductor (MOS) linear image sensor consisting of an array of 128 self- scanning, linear photodiodes was used to measure the velocity of falling grain. The sensor was used to obtain an image of the falling grain wait a known time interval and then obtain a second image. Comparison of the two images permitted determination of the position displacement experienced by the grain. Optical relationships were used to convert the image displacement to grain displacement. Grain displacement divided by the time interval yielded grain velocity. This paper addresses the sensor and data acquisition hardware, the digital signal processing software, and calibration of the sensor.

Citation Download Citation

Changhe Chen, Michael F. Kocher, and David D. Jones "Grain velocity measurement using a linear image sensor", Proc. SPIE 1836, Optics in Agriculture and Forestry, (12 May 1993); https://doi.org/10.1117/12.144022

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