30 April 1993 Frequency standards at 1.523 μm based on 20Ne and at 1.56 μm derived from the 0.780 μm Rb frequency standard
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Proceedings Volume 1837, Frequency-Stabilized Lasers and Their Applications; (1993) https://doi.org/10.1117/12.143665
Event: Applications in Optical Science and Engineering, 1992, Boston, MA, United States
Abstract
This paper reports experimental work towards a laboratory standard based on the 20Ne transition at 1.523 micrometers , some calibration measurements to 2.5 parts in 107 on lines of C2H2 between 1.52 and 1.545 micrometers , and investigation of a standard at 1.56 micrometers involving a CO line. Progress is described towards measurement of the latter line by frequency doubling to, and beating against, a Rb D2-line stabilized laser at 0.780 micrometers of known frequency.
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David J. Knight, K. I. Pharaoh, Geoffrey P. Barwood, David A. Humphreys, Christopher J. Hodges, Martin Lawrence, Keith H. Cameron, "Frequency standards at 1.523 μm based on 20Ne and at 1.56 μm derived from the 0.780 μm Rb frequency standard", Proc. SPIE 1837, Frequency-Stabilized Lasers and Their Applications, (30 April 1993); doi: 10.1117/12.143665; https://doi.org/10.1117/12.143665
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