Laser damage threshold measurements in Q-switch materials

Madhu A. Acharekar; James L. Montgomery

doi:10.1117/12.147776

24 June 1993 Laser damage threshold measurements in Q-switch materials

Madhu A. Acharekar, James L. Montgomery

Proceedings Volume 1848, 24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992; (1993) https://doi.org/10.1117/12.147776
Event: Optical Materials for High Power Lasers, 1992, Boulder, CO, United States

Abstract

Materials used for electro-optics (EO) and acousto-optics (AO) Q-switches in lasers include fused silica (SiO₂), lithium niobate (LiNbO₃), and tellurium oxide (TeO₂). The damage threshold measured for these materials is presented in this technical paper. Also, the Q-switch data collected for chromium, thulium, and holmium doped YAG (CTH:YAG) laser operating at 2.1 micrometers are reported.

Citation Download Citation

Madhu A. Acharekar and James L. Montgomery "Laser damage threshold measurements in Q-switch materials", Proc. SPIE 1848, 24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials: 1992, (24 June 1993); https://doi.org/10.1117/12.147776

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