16 June 1993 Modal reflectivity of horizontal cavity surface-emitting lasers, amplifiers, and SLEDs
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Proceedings Volume 1850, Laser Diode Technology and Applications V; (1993) https://doi.org/10.1117/12.146917
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
Abstract
In this paper a beam propagation model used to compute model reflectivities of HC SELs, amplifiers, and SLEDs will be presented. These devices all employ an intracavity 45 degree(s) micromirror which causes the light to propagate in a direction perpendicular to the epilayers. The lack of a waveguide structure for propagation perpendicular to the epilayers and the broad angular spectrum produced by highly confined transverse modes of GRINSCH-SQW devices must be considered when analyzing folded-cavity devices. The model includes Fresnel reflections from multilayer thin-films, angular errors in the 45 degree(s) micromirror, the dependence on the horizontal reflector separation, Fresnel beam propagation, and waveguide coupling losses of the reflected field. The model predicts good conversion efficiencies, despite low effective reflectivities from the folded-end-mirror. There is good agreement with experimental data.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis P. Bowler, Oscar M. Stafsudd, Michael Jansen, Szutsun Simon Ou, Jane J. Yang, Moshe Sergant, Cynthia A. Hess, and Chan A. Tu "Modal reflectivity of horizontal cavity surface-emitting lasers, amplifiers, and SLEDs", Proc. SPIE 1850, Laser Diode Technology and Applications V, (16 June 1993); doi: 10.1117/12.146917; https://doi.org/10.1117/12.146917
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