23 July 1993 Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components
Author Affiliations +
Proceedings Volume 1852, Nonlinear Optical Properties of Advanced Materials; (1993) https://doi.org/10.1117/12.148436
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
Abstract
We demonstrate a new method for investigating the orientational distribution of the rod-like poly[bis(m-butoxyphenyl) silane] molecules in Langmuir-Blodgett (LB) films. The first two non-trivial in-plane orientational order parameters C2 and C4 could be easily deduced by measuring the independent tensor components of (chi) (3)(-(omega) 3;(omega) 1,(omega) 1,(omega) 2). Using this method, we show that the annealing process improves the molecular alignment along the dipping direction. We were also able to get information about the domain morphology of the film from the off-diagonal components of (chi) (3).
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Myoungsik Cha, Myoungsik Cha, Dieter Neher, Dieter Neher, F. W. Embs, F. W. Embs, Silvia Mittler-Neher, Silvia Mittler-Neher, George I. Stegeman, George I. Stegeman, } "Determination of the orientational order parameters in polysilane LB-films by measuring third-order-susceptibility tensor components", Proc. SPIE 1852, Nonlinear Optical Properties of Advanced Materials, (23 July 1993); doi: 10.1117/12.148436; https://doi.org/10.1117/12.148436
PROCEEDINGS
11 PAGES


SHARE
Back to Top