Imaging modes and contrast in near-field scanning optical microscopy

Ricardo Toledo-Crow; Mehdi Vaez-Iravani

doi:10.1117/12.146364

4 June 1993 Imaging modes and contrast in near-field scanning optical microscopy

Proceedings Volume 1855, Scanning Probe Microscopies II; (1993) https://doi.org/10.1117/12.146364
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

Near field scanning optical microscopy (NSOM) provides a number of unique capabilities for high resolution imaging. In this regard, a fundamental aspect of the technique is its ability to retain much of the characteristics available in diffraction limited optical probing. Results are presented on the use of near field scanning optical microscopy (NSOM) in imaging a variety of samples, using different contrast mechanisms. The approaches adopted are based on the recently introduced simultaneous, non-contact, near field optical microscope with atomic force regulation. Amongst the techniques discussed are linearized polarizing microscopy, as well as amplitude, and phase, interference contrast imaging modalities.

Citation Download Citation

Ricardo Toledo-Crow and Mehdi Vaez-Iravani "Imaging modes and contrast in near-field scanning optical microscopy", Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); https://doi.org/10.1117/12.146364

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