Further magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry

Anthony DiCarlo; Michael R. Scheinfein; Ralph V. Chamberlin

doi:10.1117/12.146376

4 June 1993 Magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry

Anthony DiCarlo, Michael R. Scheinfein, Ralph V. Chamberlin

Proceedings Volume 1855, Scanning Probe Microscopies II; (1993) https://doi.org/10.1117/12.146376
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States

Abstract

We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

Citation Download Citation

Anthony DiCarlo, Michael R. Scheinfein, and Ralph V. Chamberlin "Magnetic force and force gradient microscopy utilizing an ultrasensitive vertical cantilever geometry", Proc. SPIE 1855, Scanning Probe Microscopies II, (4 June 1993); https://doi.org/10.1117/12.146376

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