9 June 1993 Lifetime of BASS devices on 50-ohm video pulser circuits
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Proceedings Volume 1873, Optically Activated Switching III; (1993) https://doi.org/10.1117/12.146561
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
The reliability of the optically triggered Bulk Avalanche Semiconductor Switch (BASS) has been assessed in a variety of test conditions. For a nominal characterization diagnostic, we have adopted a 50-ohm video transmission line having a pulsewidth of 0.5 ns. At 11 kV input voltage we have found BASS lifetimes in excess of 1 Billion pulse. This level of device lifetime is a record achievement for optically triggered semiconductor switches. The reliability distribution is found to be of Weibull type. We discuss the implications of the reliability distribution and the performance of the device during lifetime evaluations.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael H. Herman, Michael H. Herman, S. M. Ahern, S. M. Ahern, Larry O. Ragle, Larry O. Ragle, Charles S. Leung, Charles S. Leung, Heikki I. Helava, Heikki I. Helava, Dave M. Rossi, Dave M. Rossi, D. Mansfield, D. Mansfield, Kenneth M. Positeri, Kenneth M. Positeri, } "Lifetime of BASS devices on 50-ohm video pulser circuits", Proc. SPIE 1873, Optically Activated Switching III, (9 June 1993); doi: 10.1117/12.146561; https://doi.org/10.1117/12.146561

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