15 July 1993 Geometric optics radome analysis wall incorporating effects of wall curvature
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Proceedings Volume 1874, Infrared and Millimeter-Wave Engineering; (1993) https://doi.org/10.1117/12.148076
Event: OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
Abstract
In this research, a principal unmodeled error contributor in radome analysis is identified as the local plane approximation at the ray intercept point. An improved approach to modeling and computing the effects of the radome wall was developed which improves the radome wall transmission wall analysis in three respects: use of surface integration, utilization of a divergence factor (DF) to account for wall curvature, and incorporation of the effects of multiple refraction (MR). Modeling an incident plane wave on an external reference plane as an ensemble of Huygen's sources, geometric optics is used to trace the fields from the reference plane through the radome wall to a receiving monopulse antenna, where the wall transmissions on each ray are collected. The fact that the integration of a bundle of rays through the radome wall, as opposed to a single ray, more densely samples the curvature variation results in a more robust model. A DF derived from Snell's law for spherical shells accounts for the local wall curvature at the ray intercept point. To validate the approach, a microwave measurement setup was assembled around a network analyzer. Swept frequency data were obtained for similar monolithic wall dielectric panels but with different wall curvatures. Comparisons were then with measured data and the predictions of the model herein.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dennis J. Kozakoff, Dennis J. Kozakoff, } "Geometric optics radome analysis wall incorporating effects of wall curvature", Proc. SPIE 1874, Infrared and Millimeter-Wave Engineering, (15 July 1993); doi: 10.1117/12.148076; https://doi.org/10.1117/12.148076
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