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12 July 1993 Modular CCD detector for x-ray crystallography
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Proceedings Volume 1900, Charge-Coupled Devices and Solid State Optical Sensors III; (1993) https://doi.org/10.1117/12.148747
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
Abstract
We have modeled the performance of x-ray crystallography detectors by combining the characteristics of the detector and the experimental conditions. From this model, we have derived a single expression, the experimental detective collection efficiency (XDCE), which predicts the detector's performance. This expression is evaluated for detectors constructed from a square array of identical modules, each module consisting of a fiberoptic taper with a phosphor x-ray converter deposited on the large end and a CCD bonded to the small end. Using this expression, we have developed a design for a modular detector. In order to explore parameters of this design, we have constructed a test detector module in which we can change the fiberoptic taper, phosphor converter and CCD. We have measured the DQE, spatial resolution, response linearity, and dynamic range for the test module for a 3:1 taper. From these measurements, we predict the performance of this type of detector for x-ray crystallography.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Walter Charles Phillips, Martin J. Stanton, Daniel M. O'Mara, Istvan Naday, and Edwin M. Westbrook "Modular CCD detector for x-ray crystallography", Proc. SPIE 1900, Charge-Coupled Devices and Solid State Optical Sensors III, (12 July 1993); https://doi.org/10.1117/12.148747
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