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6 May 1993 PC-based real-time defect imaging system for high-speed web inspection
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Proceedings Volume 1907, Machine Vision Applications in Industrial Inspection; (1993) https://doi.org/10.1117/12.144808
Event: IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology, 1993, San Jose, CA, United States
Abstract
PC-based inspection systems for wide web materials have been unable to effectively image fine defects as they are detected. The amount of data produced by highly parallel video inspection cameras can exceed 400 MBytes/sec. The system described in this paper is capable of analyzing and displaying a detected image within seconds of the even using a single frame grabber and a 386 computer. The system can operate at processing speeds of greater than 400 MBytes/sec since it makes use of a novel post processing algorithm within the camera itself. The video cameras are based on TDI (Time Delay and Integration) technology to provide high grey scale resolution at high data rates and low light levels. The system has an adjustable resolution ranging from 2000 to 24,000 pixels per line scanned. The scanning rate is adjustable to a maximum of 20,000 line scans per second.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James W. Roberts, S. D. Rose, Graham A. Jullien, Lee T. Nichols, P. Tom Jenkins, Savvas G. Chamberlain, Gerhard Maroscher, R. Mantha, and David J. Litwiller "PC-based real-time defect imaging system for high-speed web inspection", Proc. SPIE 1907, Machine Vision Applications in Industrial Inspection, (6 May 1993); https://doi.org/10.1117/12.144808
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