Double Michelson Interferometer For Contactless Thermal Expansion Measurements

E. G. Wolff; S. A. Eselun

doi:10.1117/12.957858

25 December 1979 Double Michelson Interferometer For Contactless Thermal Expansion Measurements

E. G. Wolff, S. A. Eselun

Proceedings Volume 0192, Interferometry; (1979) https://doi.org/10.1117/12.957858
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

Laser interferometry provides adequate range and resolution for thermal expansion measurements. However, accuracy can be achieved only if the relative motions of the sample and the optics are known and/ or accounted for. The system described incorporates self compensating features into the optics. Signal processing techniques for real time length change recording are also discussed.

Citation Download Citation

E. G. Wolff and S. A. Eselun "Double Michelson Interferometer For Contactless Thermal Expansion Measurements", Proc. SPIE 0192, Interferometry, (25 December 1979); https://doi.org/10.1117/12.957858

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