8 August 1993 Subhalf-micron stepper with a reticle particle monitor
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We developed subhalf micron steppers, the FPA-2500i2 and the FPA-2500i3 (abbreviated here as i2 and i3, respectively), suitable to 16 M and 64 M DRAM processes. These new steppers incorporate high sensitivity reticle particle monitors (RPM) in order to increase chip yield. In this report, first the steppers' basic performance is demonstrated. Secondly, the printability of particles and its influence on circuit patterns are quantified by simulations and experiments. Thirdly, the RPM's detection principle is discussed theoretically, and finally the experimental results are shown.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michio Kohno, Michio Kohno, Nobuhiro Kodachi, Nobuhiro Kodachi, Kazumi Yajima, Kazumi Yajima, Seiya Miura, Seiya Miura, } "Subhalf-micron stepper with a reticle particle monitor", Proc. SPIE 1927, Optical/Laser Microlithography, (8 August 1993); doi: 10.1117/12.150453; https://doi.org/10.1117/12.150453


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