14 December 1992 Submillimeter and microwave residual losses in epitaxial films of y-ba-cu-o and ti-ca-ba-cu-o
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 19290C (1992) https://doi.org/10.1117/12.2298129
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
We have used a novel bolometric technique and a resonant technique to obtain accurate submillimeter and microwave residual loss data for epitaxial thin films of YBa2Cu3O7, T12Ca2Ba2Cu3010 and T12CaBa2Cu208. For all films we obtain good agreement between the submillimeter and microwave data, with the residual losses in both the Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O films scaling aproximately as frequency squared below - 1 THz. We are able to fit the losses in the Y-Ba-Cu-O films to a two fluid and a weakly coupled grain model for the a-b plane conductivity, in good agreement with results from a Kramers-Kronig analysis of the loss data.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Miller, D. Miller, } "Submillimeter and microwave residual losses in epitaxial films of y-ba-cu-o and ti-ca-ba-cu-o", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19290C (14 December 1992); doi: 10.1117/12.2298129; https://doi.org/10.1117/12.2298129
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