14 December 1992 Far-infrared microscopy of low-dimensional semiconductors
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 192919 (1992) https://doi.org/10.1117/12.2298162
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
Sub-wavelength focusing of far-infrared light-using tapered hollow and coaxial waveguides-is introduced to spatially resolve inhomogeneities and edges of semicon- ductor structures with reduced dimensions.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Reimund Merz, "Far-infrared microscopy of low-dimensional semiconductors", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 192919 (14 December 1992); doi: 10.1117/12.2298162; https://doi.org/10.1117/12.2298162
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