14 December 1992 On the work mechanism of mim point contact diodes
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 19292V (1992) https://doi.org/10.1117/12.2298220
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
We have performed systematic measurements on a W-Ni MIM point contact diode at different IR, FIR, and IF frequencies in order to investigate the mechanisms responsible for the different response times observed in the diode operation. Our results led to the experimental confirmation of a second effect of thermal nature, besides tunnel effect, responsible for the diode operation. We measure the cutoff frequency of this second effect, which results in good agreement with our theoretical interpretation (see: Int'l J. of IR and MM Waves, August 1992 ).
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. Carelli, "On the work mechanism of mim point contact diodes", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19292V (14 December 1992); doi: 10.1117/12.2298220; https://doi.org/10.1117/12.2298220
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