14 December 1992 The reliability of planar GaAs Schottky diodes
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 192930 (1992) https://doi.org/10.1117/12.2298225
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
Planar GaAs Schottky barrier mixer diodes are now being used in a variety of applications at millimeter and submillimeter wavelengths. Since these devices are being considered for space applications, device reliability is a critical issue. This paper presents first results from accelerated life testing of planar mixer diodes.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jodi L. Bowers, "The reliability of planar GaAs Schottky diodes", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 192930 (14 December 1992); doi: 10.1117/12.2298225; https://doi.org/10.1117/12.2298225
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