14 December 1992 Characterization of microstrip meander line slow-wave structures for applications in mm-wave printed circuits
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 19295P (1992) https://doi.org/10.1117/12.2298322
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
This paper reveals potential applications of microstrip meander line slow-wave structures in MM-Wave MMIC circuits. Transmission and reflection coefficients are computed employing dyadic Green functions and Sommerfield integral. Computer analysis has assumed lossless substrate and microstrip transmission lines with strip thickness much less than wavelength. Resistive and surface wave losses are included in the mathematical treatment. Frequency dependent, surface impedance boundaries are evaluated using a quasi-TEM mode computer analysis. This provides on overall effect of the penetration by the electric field and the resultant current distribution within the microstrip lines. Potential applications of these structures include phase shifters, filters, and delay lines.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. R. Jha, A. R. Jha, } "Characterization of microstrip meander line slow-wave structures for applications in mm-wave printed circuits", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19295P (14 December 1992); doi: 10.1117/12.2298322; https://doi.org/10.1117/12.2298322
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