14 December 1992 Characterization of unilateral finline considering the conductor thickness
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Proceedings Volume 1929, 17th International Conference on Infrared and Millimeter Waves; 19296N (1992) https://doi.org/10.1117/12.2298356
Event: 17th International Conference on Infrared and Millimeter Waves, 1992, Pasadena, CA, United States
Abstract
The theories and numerical results are presented to the effective dielectric constant and characteristic impedance of unilateral finline structures, considering the conductor thickness of the metal fins. The full wave analysis of the transverse transmission line-TTL, that is a direct method, is used. These numerical results are interesting to be used in practical experiences by considering the conductor thick- ness.
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Humberto Cesar Chaves Fernandes, Humberto Cesar Chaves Fernandes, } "Characterization of unilateral finline considering the conductor thickness", Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19296N (14 December 1992); doi: 10.1117/12.2298356; https://doi.org/10.1117/12.2298356
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