14 May 1993 Planar waveguides fabricated by proton irradiation in quartz silica
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Proceedings Volume 1932, Guided-Wave Optics; (1993) https://doi.org/10.1117/12.145596
Event: Guided Wave Optics, 1992, Moscow, Russian Federation
Parameters of refractive-index profile, the birefringence value, and mode interference pattern of buried planar waveguides fabricated by proton irradiation with doses from 1014 to 1017 cm-2 have been investigated experimentally. It has been shown that the Epsteyn model is a good approximation of waveguide refractive-index profile. The mechanical stress distribution in such waveguide layers has been studied by optical methods. A method for reconstructing the radiation induced defect distribution in the collision region has been proposed. The value of the proportionality factor in the refractive-index increment dependence on dose was determined more exactly on the basis of experimental data. Changes of the waveguide parameters dependent on the temperature of isochronous annealing also have been investigated.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Tomov, A. V. Tomov, L. M. Shteyngart, L. M. Shteyngart, V. P. Red'ko, V. P. Red'ko, Anton V. Malko, Anton V. Malko, "Planar waveguides fabricated by proton irradiation in quartz silica", Proc. SPIE 1932, Guided-Wave Optics, (14 May 1993); doi: 10.1117/12.145596; https://doi.org/10.1117/12.145596

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