The in-flight calibration of the EOS Multi-angle Imaging SpectroRadiometer (MISR) will be achieved, in part, by observing deployable Spectralon panels. This material reflects light diffusely, and allows all cameras to view a near constant radiance field. This is particularly true when a panel is illuminated near the surface normal. To meet the challenging MISR calibration requirements, however, very accurate knowledge of the panel reflectance must be known for all utilized angles of illumination, and for all camera and monitoring photodiode view angles. It is believed that model predictions of the panels bidirectional reflectance distribution function (BRDF) can be used in conjunction with a measurements program to provide the required characterization. This paper describes the results of a model inversion which was conducted using measured Spectralon BRDF data at several illumination angles. Four physical parameters of the material were retrieved, and are available for use with the model to predict reflectance for any arbitrary illumination or view angle. With these data the root mean square difference between the model and the observations is currently of the order of the noise in the data, at about +/- 1%. With this success the model will now be used in a variety of future studies, including the development of a measurements test plan, the validation of these data, and the prediction of a new BRDF profile, should the material degrade in space.