Optical truss and retroreflector modeling for picometer laser metrology

Braden E. Hines

doi:10.1117/12.155741

10 September 1993 Optical truss and retroreflector modeling for picometer laser metrology

Braden E. Hines

Proceedings Volume 1947, Spaceborne Interferometry; (1993) https://doi.org/10.1117/12.155741
Event: Optical Engineering and Photonics in Aerospace Sensing, 1993, Orlando, FL, United States

Abstract

Space-based astrometric interferometer concepts typically have a requirement for the measurement of the internal dimensions of the instrument to accuracies in the picometer range. While this level of resolution has already been achieved for certain special types of laser gauges, techniques for picometer-level accuracy need to be developed to enable all the various kinds of laser gauges needed for space-based interferometers. Systematic errors due to retroreflector imperfections become important as soon as the retroreflector is allowed to either translate in position or articulate in angle away from its nominal zero-point. Also, when combining several laser interferometers to form a three-dimensional laser gauge (a laser optical truss), systematic errors due to imperfect knowledge of the truss geometry are important as the retroreflector translates away from its nominal zero-point. In order to assess the astrometric performance of a proposed instrument, it is necessary to determine how the effects of an imperfect laser metrology system impact the astrometric accuracy. This paper show the development of an error propagation model from errors in the 1-D metrology measurements through the impact on the overall astrometric accuracy for OSI. Simulations are then presented based on this development which were used to define a multiplier which determines the 1-D metrology accuracy required to produce a given amount of fringe position error.

Citation Download Citation

Braden E. Hines "Optical truss and retroreflector modeling for picometer laser metrology", Proc. SPIE 1947, Spaceborne Interferometry, (10 September 1993); https://doi.org/10.1117/12.155741

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