15 November 1993 Stability of IAD refractory oxide narrowband interference filters
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Abstract
The physical and spectral characteristics of refractory oxide narrowband optical filters, fabricated with an ion-assisted deposition process are investigated. The properties of tantalum pentoxide (Ta2O5) and silicon dioxide (SiO2) are compared with more conventional zinc sulfide (ZnS) and cryolite (Na3AlF6) optical interference filters, for effects of radiation, moisture and abrasion, as well as thermal stability. Filter longevity and thermal properties are dramatically improved, which can have a significant impact on the performance of space-borne optical systems.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John R. Potter, John C. Simons, "Stability of IAD refractory oxide narrowband interference filters", Proc. SPIE 1952, Surveillance Technologies and Imaging Components, (15 November 1993); doi: 10.1117/12.161397; https://doi.org/10.1117/12.161397
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