13 August 1993 AEDC's Scene Generation Test Capability (SGTC) using Direct Write Scene Generation (DWSG)
Author Affiliations +
A Scene Generation Test Capability (SGTC) is under development at Arnold Engineering Development Center (AEDC) which uses Direct Write Scene Generation (DWSG) as a tool to project realistic mission scenarios into sensors operating in a simulated space system environment. This capability can reduce the risk associated with developing advanced sensor systems. The second phase of this program, a Focal Plane Array Test Chamber (FPATC), is currently underway which expands the capabilities of the phase one Transportable Direct Write Scene Generator (TDWSG) reported previously. Projection wavelengths for the system include 0.514, 1.06, 5.4 and 10.6 micrometers . Multiple chamber configurations will be used to accommodate different types of test articles. The FPATC is also transportable. User testing has begun in the TDWSG. This paper will present an overview of the current SGTC program.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heard S. Lowry, Heard S. Lowry, Parker David Elrod, Parker David Elrod, } "AEDC's Scene Generation Test Capability (SGTC) using Direct Write Scene Generation (DWSG)", Proc. SPIE 1967, Characterization, Propagation, and Simulation of Sources and Backgrounds III, (13 August 1993); doi: 10.1117/12.151076; https://doi.org/10.1117/12.151076


Scan lens design for Direct Write Scene Generation
Proceedings of SPIE (August 10 1993)
Midwave-infrared snapshot imaging spectrometer
Proceedings of SPIE (January 17 2002)
DESTINY: the dark energy space telescope
Proceedings of SPIE (September 20 2007)
Distortion calibration of the MISR linear detectors
Proceedings of SPIE (November 11 1996)

Back to Top