15 September 1993 Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption
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The goal of this research was to map the regimes of validity of the weak-line and strong-line limits as a function of temperature, pressure, and path length for the 2.7 micrometers and 6.3 micrometers H2O absorption bands. These calculations were done using an updated version of the NASA band model. A parametric study was performed where the error in assuming the validity of the two limits was calculated as a function of the physical parameters temperature, pressure, and path length. Results were generated in the form of spectral plots of the error and as band-integrated error presented in contour plots as a function of temperature and path length. Results indicate that for both bands, the weak-line error is localized in regions of intermediate temperatures and pressures at all path lengths. The strong-line limit error shows a linear increasing trend with pressure at short path lengths, while varying as a saddle-shaped function with respect to temperature and pressure at longer path lengths.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre V. Villeneuve, Pierre V. Villeneuve, Curtis H. Stern, Curtis H. Stern, } "Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption", Proc. SPIE 1968, Atmospheric Propagation and Remote Sensing II, (15 September 1993); doi: 10.1117/12.154881; https://doi.org/10.1117/12.154881

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