Near-infrared diffuse reflectance analysisâ€"are we sure we know what we are measuring?

Michael Goldstein

doi:10.1117/12.958002

17 December 1979 Near-infrared diffuse reflectance analysis-are we sure we know what we are measuring?

Michael Goldstein

Proceedings Volume 0197, Modern Utilization of Infrared Technology V; (1979) https://doi.org/10.1117/12.958002
Event: 23rd Annual Technical Symposium, 1979, San Diego, United States

Abstract

The basic theory of Kubelka and Munk for diffuse reflectance from powdered solids is critically examined for its applicability to quantitative analysis in the near-infrared region of the spectrum (0.5-2.5μm). The effect of regular reflection, layer thickness, particle size, moisture, background absorption, and other aspects are considered, and the implications for available methods used for such analytical measurements are discussed. Examples are presented of severe departures from expected behaviour (i.e. irregular analytical calibration curves), and it is shown that these 'anomalies' arise from inexact definition of the nature of the species being measured.

Citation Download Citation

Michael Goldstein "Near-infrared diffuse reflectance analysis-are we sure we know what we are measuring?", Proc. SPIE 0197, Modern Utilization of Infrared Technology V, (17 December 1979); https://doi.org/10.1117/12.958002

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