3 September 1993 Two-wavelength heterodyne interferometer with extended measurement range
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Proceedings Volume 1978, Coherent Measuring and Data Processing Methods and Devices; (1993) https://doi.org/10.1117/12.155052
Event: Coherent Measuring and Data Processing Methods and Devices: Selected Papers, 1993, Bellingham, WA, United States
Abstract
The article describes the circuit of a two-wavelength heterodyne interferometer operating in a spectral region of 10.6 micrometers and intended for control of the shape of the primary segment mirror of an infrared telescope. The experimental data obtained for a model of a three-element segment mirror is presented. The design of a two-wavelength interferometer to be used for aspherical mirrors testing and polished optical surfaces is proposed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. A. Baklagin, V. V. Ridiger, P. P. Zaharov, "Two-wavelength heterodyne interferometer with extended measurement range", Proc. SPIE 1978, Coherent Measuring and Data Processing Methods and Devices, (3 September 1993); doi: 10.1117/12.155052; https://doi.org/10.1117/12.155052
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