3 September 1993 Two-wavelength heterodyne interferometer with extended measurement range
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Proceedings Volume 1978, Coherent Measuring and Data Processing Methods and Devices; (1993) https://doi.org/10.1117/12.155052
Event: Coherent Measuring and Data Processing Methods and Devices: Selected Papers, 1993, Bellingham, WA, United States
Abstract
The article describes the circuit of a two-wavelength heterodyne interferometer operating in a spectral region of 10.6 micrometers and intended for control of the shape of the primary segment mirror of an infrared telescope. The experimental data obtained for a model of a three-element segment mirror is presented. The design of a two-wavelength interferometer to be used for aspherical mirrors testing and polished optical surfaces is proposed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
E. A. Baklagin, E. A. Baklagin, V. V. Ridiger, V. V. Ridiger, P. P. Zaharov, P. P. Zaharov, } "Two-wavelength heterodyne interferometer with extended measurement range", Proc. SPIE 1978, Coherent Measuring and Data Processing Methods and Devices, (3 September 1993); doi: 10.1117/12.155052; https://doi.org/10.1117/12.155052
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