As neuroprostheses are reduced in size, and as they are implanted in younger individuals with increasing life expectancies, the demands on the biomaterials used to protect them from the hostile extracellular environment are increased. Thus, implantable electronic packages must meet stringent quality assurance specifications, which dictate that both gross (approximately 10-4 atm cc/sec) and fine (approximately 10-8 atm cc/sec) leak testing must be performed on even very delicate packages. For such devices, Van der Lugt Optical Correlation (VLOC) Techniques offer the potential of superseding conventional leak testing methodologies, in that working with light is cleaner, faster, more sensitive, and eliminates the disadvantages of tracer gas introduced through backfilling or `bombing.' This paper briefly presents VLOC techniques, coupled with a discussion of basic leak theory. The ability of the method to detect and to estimate the size of leaks down to 10-6 atm cc/sec is demonstrated, and a comparison is made between VLOC techniques and conventional helium leak testing methodology in terms of accuracy, speed, efficiency, and total cost.