1 April 1993 Detecting defects and showing their position in a deep hole by means of CCD camera
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Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142040
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China
Abstract
The small, put-in, optical testing head described in the paper is available to detect the inner surface defects in a deep hole. It is composed of the following advanced techniques: CCD camera, step motor, grating displacement measurement unit, etc. It can be put in a hole thats diameter is larger than 40 mm and can scan in axial and diametrical directions, recording the image by intermittent CCD camera. The detecting position and image data can be memorized by computer to analyze and process. The resolution of the testing head is better than 0.04 mm.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Muxing Liu, Muxing Liu, Zhenying Liu, Zhenying Liu, Qian Mi, Qian Mi, Binghua Su, Binghua Su, } "Detecting defects and showing their position in a deep hole by means of CCD camera", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); doi: 10.1117/12.142040; https://doi.org/10.1117/12.142040
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