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1 April 1993 Intersection-point calculations for electron-optical devices
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Proceedings Volume 1982, Photoelectronic Detection and Imaging: Technology and Applications '93; (1993) https://doi.org/10.1117/12.142075
Event: Photoelectronic Detection and Imaging: Technology and Applications '93, 1993, Beijing, China
Abstract
A method for computing the intersection point of a ray in a potential field for electron-optical devices is presented. This method is applied for three or four component ray trace schemes which are based on the electron-optical analogy. The method requires only three adjacent integration points of ray trajectory where the last point is located behind the given surface. In this way the best possible accuracy for numerical ray-trace schemes of the fourth order can be obtained.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jerzy M. Woznicki and Jacek Grzegorz Puchalski "Intersection-point calculations for electron-optical devices", Proc. SPIE 1982, Photoelectronic Detection and Imaging: Technology and Applications '93, (1 April 1993); https://doi.org/10.1117/12.142075
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