26 July 1993 Effect of probe scattering on near field optical imaging of small phase objects: microwave measurements and numerical simulation
Author Affiliations +
Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19832D (1993) https://doi.org/10.1117/12.2308504
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Measurements for investigation of collection and reflection mode scanning near field optical microscopy (SNOM) image generation are performed in the near field of small phase objects using 3 cm microwave interferometers and a tapered open rectangular waveguide as near field probe. Measured field distributions are compared with moment method calculations, including probe scattering. A good agreement is obtained.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael Totzeck, Michael Totzeck, } "Effect of probe scattering on near field optical imaging of small phase objects: microwave measurements and numerical simulation", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19832D (26 July 1993); doi: 10.1117/12.2308504; https://doi.org/10.1117/12.2308504
PROCEEDINGS
2 PAGES


SHARE
Back to Top