26 July 1993 A method for measuring GRIN profile based on Talbot effect
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19832G (1993) https://doi.org/10.1117/12.2308507
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
adient. index tenses is required to characterize their imaging and focussing properties. Various holographic and interferometric techniques have beers devetoped for such measurements (1-43. Generally r. i. profites are measured by standa
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Biswas, N. Biswas, } "A method for measuring GRIN profile based on Talbot effect", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19832G (26 July 1993); doi: 10.1117/12.2308507; https://doi.org/10.1117/12.2308507
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