26 July 1993 Photoacoustic spectroscopic measurements for silver thin films using surface plasmons resonance detection
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 198337 (1993) https://doi.org/10.1117/12.2308534
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
In this paper we present the experimental results of the study of silver thin films using a photoacoustic spectroscopic system. The experimental setup incorporates a pulsed N2 pumped dye laser, a mechanical chopped ion argon and He- Ne lasers as tunable ligth sources to scan the sample over a wide wavelength range. With the laser as the light source, it is possible to obtain a signal to noise ratio that is better than the obtained by means of a coupled monochromator with a white light source in the experiments. The sample setup is a conventional Kretschmann-Reather' configuration with a rigth angle prism oil matched with the substrate on which it is evaporated the Ag thin film with thickness of 300A and 500A. By using the photoacoustic technique, we expect to have a lower intensity in the photoacoustic signal associated with the surface plasmon (SP) resonance, due to the probability of radiative decay of the plasmon. In our experiments we found that the frecuency of the chopped ligth, obtained for the SP signal detection was 4Hz, and it could be increased up to 60Hz as the maximum frecuency where we still have a signal; this differ with the results of other authors. We also present the behavior of the dispersion curve for Ag thin films, which it depends on the wavelength and the incidence angle scans. Finally, we compare the photoacoustic data plots with the Attenuated Total Reflection (ATR) for the samples.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Villagomez, "Photoacoustic spectroscopic measurements for silver thin films using surface plasmons resonance detection", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198337 (26 July 1993); doi: 10.1117/12.2308534; https://doi.org/10.1117/12.2308534
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