26 July 1993 Effect of random rough interfaces in a multilayer stack
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19833G (1993) https://doi.org/10.1117/12.2308543
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
The sum of several periodic functions is used as an approach to simulate random interfaces in multilayers where a metal is coated with a dielectric thin-film or viceversa. Experimental deviations from reflectivity of such systems respect to those with smooth interfaces are well explained with the Rayleigh theory.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Garcia Llamas, R. Garcia Llamas, } "Effect of random rough interfaces in a multilayer stack", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19833G (26 July 1993); doi: 10.1117/12.2308543; https://doi.org/10.1117/12.2308543
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