26 July 1993 Comparative study of the diffraction efficiency and scattering of bleached holograms recorded with an Nd:YaG pulsed laser at 532 nm
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19836E (1993) https://doi.org/10.1117/12.2308649
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
A wide spatial frequency band ( including almost zero frequency ) of a hologram is needed for some practical purposes, for a example, for recording the hologram of a speckle-pattern of a laser beam transmitted through a multimode fiber. We present results of a theoretical analysis and experimental research which show what photorefractive medium must be used to achieve a wide space-frequency band. The significant peculiarity of phase-locked method of recording holograms is non-zero diffraction efficiency at the value of grating wave vector close to zerol. However the efficiency for that method decreases as a the wave vector increases. We were successful in describing the recording of a hologram by equations which take into account self-diffraction. We solved differential equations numerically using material parameters of ferroelectrics and sillenits2. It is turned out that influence of self-diffraction is more prominent for ferroelectrics than for sillenits and the space-frequency band is some times larger for the first materials than for the second one. The experimental investigations were performed in the undopped ferroeleotric crystal Ba2Nan5015 (NBN) and in the sillenite crystal Bi12S1020 (BSO).
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sanjay Kumar, Sanjay Kumar, } "Comparative study of the diffraction efficiency and scattering of bleached holograms recorded with an Nd:YaG pulsed laser at 532 nm", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19836E (26 July 1993); doi: 10.1117/12.2308649; https://doi.org/10.1117/12.2308649
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