23 July 1993 Determination of the wire profile of highly conducting wire gratings using an electromagnetic theory of diffraction
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 198372 (1993) https://doi.org/10.1117/12.2308673
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
In a paper published in 1969 it was shown theoretically that within the accuracy of the first Born approximation, the low spatial-frequency components of the distribution of the refractive index throughout a semi-transparent object may be determined from measurements of the field scattered by the object at finite distances from it.1 First preliminary experiments, which verified the correctness of the theoretical predictions were performed soon afterwards.2'3 These investigations were carried forward by many workers (see, for example refs. 4 - 7) and have led to the development of the broad field of diffraction tomography, which is beginning to find useful applications.8-11 A mathematical theorem derived in ref. 1, which makes it possible to perform the reconstruction, has become of basic importance for diffraction tomography, where it is sometimes called the Fourier diffraction theorem.12
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Hans Lochbihler, Hans Lochbihler, } "Determination of the wire profile of highly conducting wire gratings using an electromagnetic theory of diffraction", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198372 (23 July 1993); doi: 10.1117/12.2308673; https://doi.org/10.1117/12.2308673
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