23 July 1993 Exact solutions for focusing of 2D electromagnetic waves
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 198379 (1993) https://doi.org/10.1117/12.2308680
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Threshold criteria for the determination of width, thickness and shape of dielectric line structures with wedge shaped edges, negligible attenuation and small refractive index n (n = 1.02, tan 5 = 0.0004) are examined in the electromagnetic nearfield (distance ::: 0.L). It is demonstrated that height and position of extreme values in the polarization dependent amplitude and phase distributions are particularly suited as thresholds.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jakob J. Stamnes, "Exact solutions for focusing of 2D electromagnetic waves", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198379 (23 July 1993); doi: 10.1117/12.2308680; https://doi.org/10.1117/12.2308680
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