23 July 1993 Ultra-wideband optical heterodyne interferometer
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19837W (1993) https://doi.org/10.1117/12.2308703
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
The dispersion relation n=n( a) (n stands for the refractive index and a stands for the wavenumber ) of a transparent sample is measured in real time through the spectral analysis of a white light interference pattern which is obtained in a Michelson interferometer when a wide, continuous spectrum light source is used. This technique (SRWLI) was recently used for high precision refractometry 1 ,
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shuko Yokoyama, Shuko Yokoyama, } "Ultra-wideband optical heterodyne interferometer", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19837W (23 July 1993); doi: 10.1117/12.2308703; https://doi.org/10.1117/12.2308703
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