23 July 1993 Digital visibility measurements by fourier analysis
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 198382 (1993) https://doi.org/10.1117/12.2308709
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
A phase-measuring Fizeau interference microscopy with a visible laser-diode (LD) source has been studied that is based on a phase-shifting method using the wavelengths varied stepwise by changing the current in LD. The influence of Fizeau fringes with multiple-beam interference on phase-extraction algorithms has been theoretically and numerically investigated. The phase error can be minimized, when two sets of measurements corresponding to initial phase difference of n/4 are averaged. Experimental results are presented.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juan Pomarico, Juan Pomarico, } "Digital visibility measurements by fourier analysis", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198382 (23 July 1993); doi: 10.1117/12.2308709; https://doi.org/10.1117/12.2308709
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