23 July 1993 Beam characterization of a high power laser using the dominant mode
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 19838Z (1993) https://doi.org/10.1117/12.2308742
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
A graphical method for single layer ellipsometric data analysis is presented. Starting from an stablished numerical procedure, valid for transparent layers, the method is useful for better understanding the reliability of the ellipsometric measurement. The procedure may also be generalized to the case of an absorbing layer.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
St. Amarande, St. Amarande, } "Beam characterization of a high power laser using the dominant mode", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 19838Z (23 July 1993); doi: 10.1117/12.2308742; https://doi.org/10.1117/12.2308742
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