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We present and discuss a Fabry-Perot type interferometric method that permits the concurrent measurement of the thermooptic coefficients of quartz retardation plates in the thermal range 25°-300 °C.
Salvador Bosch
"Simple graphical method for single layer ellipsometry data analysis", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198390 (23 July 1993); https://doi.org/10.1117/12.2308743
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Salvador Bosch, "Simple graphical method for single layer ellipsometry data analysis," Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 198390 (23 July 1993); https://doi.org/10.1117/12.2308743