23 July 1993 Surface profilometry by means of wavelength-shifting in spectral modulation
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AO (1993) https://doi.org/10.1117/12.2308803
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
A novel method for measuring the displacement of moving objective regardless of its rotation and scaling is introduced. The algorithm, the results of computer emulation and the experimental results are presented.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Calatroni, J. Calatroni, } "Surface profilometry by means of wavelength-shifting in spectral modulation", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AO (23 July 1993); doi: 10.1117/12.2308803; https://doi.org/10.1117/12.2308803
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