23 July 1993 Absolute flatness testing by an extended rotation method: measurements
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AS (1993) https://doi.org/10.1117/12.2308807
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Loose portions of a plaster layer carrying a historical mural are identified by electronic speckle pattern interferometry of acoustical- ly excited vibrations.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K.-E. Elssner, "Absolute flatness testing by an extended rotation method: measurements", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AS (23 July 1993); doi: 10.1117/12.2308807; https://doi.org/10.1117/12.2308807
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