23 July 1993 Mapping of plaster detachments in historical murals by electronic speckle pattern interferometry (ESPI)
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Proceedings Volume 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology; 1983AT (1993) https://doi.org/10.1117/12.2308808
Event: 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1993, Budapest, Hungary
Abstract
Double spectral modulation is a new interferometric procedure which enables encoding the profile of a 2-D optical pupil z(x,y) in the wide, continuous spectrum of a light beam ( 1 ). The optical phase of such a beam depends both on the profile of the surface and on the light wavelength. Because of this the phase rate change could become zero ( stationary phase situation) at certain points where the surface gradient takes specific values and since knowledge of the direction of the phase increase is necessary for the phase - retrieving seeking process, reaching stationary phase points puts usually and end to it and hence to the finding of the surface z(x,y). In this paper we present a technique which overcomes this problem and so allows the obtention of the whole surface profile of a reflecting surface. The specimen being a reflecting surface takes the place of one of the mirrors in a Michelson interferometer and is illuminated by a wide, continuous-spectrum light source. At the plane of fringe localization the light intensity is related to the phase by
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G. Gülker, G. Gülker, } "Mapping of plaster detachments in historical murals by electronic speckle pattern interferometry (ESPI)", Proc. SPIE 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology, 1983AT (23 July 1993); doi: 10.1117/12.2308808; https://doi.org/10.1117/12.2308808
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